Scanning tunneling microscopy observation of surface superstructures during the growth of In on In/Si(111) surface
نویسندگان
چکیده
a Department of Physics and Shanghai Jiao Tong University, 200240 Shanghai, China b Institute of Applied Physics, CREST-JST, University of Tsukuba, 305-8573 Tsukuba, Japan c Shanghai Key Laboratory of Modern Optical System, University of Shanghai for Science and Technology, 200093 Shanghai, China d Department of Physics, Tsinghua University, 100084 Beijing, China e Research Institute of Micro/Nano Science and Technology, Shanghai Jiao Tong University, 200240 Shanghai, China
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